Jeol
Supporting science and technology around the world for 75 years
Discover our complete range of high-quality products designed to meet your needs.
Quick and easy to operate and get high-contrast and high-resolution images.
The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow.
The JEM-Z200MF is an electron microscope with magnetic field-free objective lens which enables high resolution observation without applying strong magnetic field to specimens.
A New Atomic Resolution Electron Microscope has been released!
'NEOARM' / JEM-ARM200F comes with JEOL's unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations.
It is a Useful Tool for Every User!
Versatility and high spatial resolution meet automation with the JSM-IT810 series FE-SEM.
Clear visibility promotes new discovery
Easy to acquire data for all specimen types
